RIGOL Technologies has expanded its UltraVision II technology platform with the introduction of the DS8000-R Rack-Mount Digital Oscilloscope. This new oscilloscope offers up to 2GHz bandwidth and the same jitter and real-time eye analysis, power analysis, and serial decode as its MSO8000 Series oscilloscope. The new space-saving oscilloscope is created for instrument synchronisation for small to large system configurations.
Providing a typical trigger jitter between instruments of lower than 350ps RMS and accessories to synchronise triggering and minimise timing offset among channels, the new oscilloscope is made for demanding system and automation applications. The scope’s ultra-thin, compact design (1U high by half-rack wide) enables two of the oscilloscopes to be mounted in a standard 1U rack height. With a total of eight 2GHz channels in 1U of rack space, the device offers unmatched density for high-speed signal acquisition. The scope can be controlled locally by HDMI monitor, mouse and keyboard, and remotely through local web control, free UltraScope PC software, or custom programming over LAN or USB.
Chris Armstrong, director of RIGOL North America, stated: “We are very excited to bring our UltraVision II Technology and the reliability of our custom ASIC designs to system applications that will take advantage of our sampling, memory, synchronisation, and analysis capabilities. The scope’s sampling clock and trigger synchronisation enable RIGOL to provide powerful solutions for multi-channel, high-speed signal acquisition applications, such as collecting transient events in high energy physics and automated industrial system testing.”
“The feature set of this powerful, rack-mounted oscilloscope opens an entirely new set of applications for RIGOL and our performance/value proposition,” continued Chris. “With its low starting price of only $3,499, the DS8000-R will enable customers to construct large scale signal acquisition systems with high-performance oscilloscope hardware that was previously impractical from an instrumentation cost perspective.”